DNA nanofilm thickness measurement on microarray in air and in liquid using an atomic force microscope.
نویسندگان
چکیده
The measurement of the thickness of DNA films on microarray as a function of the medium (liquid, air) is gaining importance for understanding the signal response of biosensors. Thiol group has been used to attach DNA strands to gold micropads deposited on silicon surface. Atomic force microscopy (AFM) was employed in its height mode to measure the change in the pad thickness and in its force mode to measure the indentation depth of the nanofilm. A good coherence between the height and force modes is observed for the film thickness in air. The adhesion force was found to be an alternative way to measure the surface coverage of the biolayer at nanoscopic scale. However the force analysis (compression, steric and electrostatic) provides baseline information necessary to interpret the AFM height image in liquid. Analysis of the film thickness distribution shows that the height of the DNA strands depends on both the DNA strand length (15-35 base pairs) and the environment (air, liquid). In air, longer strands lay down onto gold surface whereas the charge reversal of gold in liquid causes a repulsion of longer strands, which stand up.
منابع مشابه
Sensitivity analysis of a caliper formed atomic force microscope cantilever based on a modified couple stress theory
A relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. An approximate solution to the flexural vibration problem is obta...
متن کاملSensitivity analysis of a caliper formed atomic force microscope cantilever based on a modified couple stress theory
A relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. An approximate solution to the flexural vibration problem is obta...
متن کاملSensitivity Analysis of Frequency Response of Atomic Force Microscopy in Liquid Environment on Cantilever's Geometrical Parameters
In this paper, the non-linear dynamic response of rectangular atomic force microscopy in tapping mode is considered. The effect of cantilever’s geometrical parameters (e.g., cantilever length, width, thickness, tip length and the angle between the cantilever and the sample's surface in liquid environment has been studied by taking into account the interaction forces. Results indicate that the r...
متن کاملSize-dependent on vibration and flexural sensitivity of atomic force microscope
In this paper, the free vibration behaviors and flexural sensitivity of atomic force microscope cantilevers with small-scale effects are investigated. To study the small-scale effects on natural frequencies and flexural sensitivity, the consistent couple stress theory is applied. In this theory, the couple stress is assumed skew-symmetric. Unlike the classical beam theory, the new model contain...
متن کاملAtomic Force Microscopy Application in Biological Research: A Review Study
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
- Biosensors & bioelectronics
دوره 21 4 شماره
صفحات -
تاریخ انتشار 2005